[1]李仲平.熱透波機理及熱透波材料進展與展望[J].中國材料進展,2013,(4):001-10.[doi:10.7502/j.issn.1674-3962.2013.04.01]
Li Zhongping.Major Advancement and Development Trends in Study of Hot-wall Microwave -transparency Mechanisms and High-temperature Microwave-transparent Materials[J].MATERIALS CHINA,2013,(4):001-10.[doi:10.7502/j.issn.1674-3962.2013.04.01]
點擊復制
熱透波機理及熱透波材料進展與展望(
)
中國材料進展[ISSN:1674-3962/CN:61-1473/TG]
- 卷:
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- 期數:
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2013年第4期
- 頁碼:
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001-10
- 欄目:
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特約研究論文
- 出版日期:
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2013-04-30
文章信息/Info
- Title:
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Major Advancement and Development Trends in Study of Hot-wall Microwave -transparency Mechanisms and High-temperature Microwave-transparent Materials
- 作者:
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李仲平
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(航天材料及工藝研究所 先進功能復合材料技術重點實驗室, 北京 100076)
- Author(s):
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Li Zhongping
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(Science and Technology on Advanced Functional Composite Materials, Aerospace Research Institute of Materials & Processing Technology, Beijing, 100076)
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- 關鍵詞:
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熱透波; 黑障; 熱障; 熔融型燒蝕; 汽化型燒蝕; 熔融/汽化混合型
- DOI:
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10.7502/j.issn.1674-3962.2013.04.01
- 摘要:
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簡要闡述了熱透波問題的產生背景及其科學技術內涵,從燒蝕傳熱行為規律、熱電行為規律與熱透波機理、高溫介電性能測試、熱透波模擬試驗和熱透波材料5個方面對國內外研究進展進行了系統總結,在此基礎上展望了熱透波材料的發展方向。研究結果表明:附有熔體的高溫壁面和動態變化的固液氣三相狀態導致天線窗/罩電性能發生突變,是高超聲速航天器產生“黑障”的主要原因。氧化硅、氮化硼和硅-氧-氮材料分別屬熔融型、氣化型和熔融/汽化混合型燒蝕熱透波材料。氣化型氮化硼的微波傳輸效率受電子電導損耗控制,熔融型氧化硅的微波傳輸效率則受離子電導損耗控制。大尺度、高精度和寬溫寬頻是熱透波材料性能評測和分析模擬技術的重要發展方向,向大尺寸“Si(B)ON(M)”三元體系跨越是熱透波材料制備技術創新發展的主要趨勢。
- Abstract:
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The background and physicsbasis of hotwall microwavetransparency problem are discussed in this paper. Major advancement is summarized in areas including behavior of ablation and heattransfer, thermodielectric behavior and hotwall microwavetransparency mechanism, hightemperature dielectric testing, simulation of hotwall microwavetransparency, and hightemperature microwavetransparent materials. Future development trends in related areas are presented. Hightemperature melt and dynamic diversification of solid/liquid/gas result in break of dielectric property for hotradome or antenna window, which is the main reason for the “blackout” of hypersonic aerospace vehicles. Silica, boron nitride and SiON material are melting ablation, evaporation ablation and melting/evaporation ablation materials respectively. The microwave transporting efficiency of boron nitride is directed by electron conducting loss, while the microwave transporting efficiency of silica is directed by ion conducting loss. Largescale, high precision, wide temperature range and wide frequency range are the main objective for next generation test and computation technology for hotwall transparent materials. Big size and Si(B)ON(M) based materials are the important trend for developing new hotwall transparent materials.
更新日期/Last Update:
2013-04-15