文章信息/Info

Title:

Three-dimensional X-ray Diffraction Technique for Metals Science

作者:

張玉彬; 范國華

Technical University of Denmark, 哈爾濱工業大學

Author(s):

ZHANG Yubin;  FAN Guohua

Technical University of Denmark, Harbin Institute of Technology

關鍵詞:

三維X射線衍射技術; 晶體結構; 微觀組織; 塑性形變; 再結晶形核及長大; 晶粒長大; 局部應力/應變分析

Keywords:

three-dimensional X-ray diffraction technique (3DXRD);  crystallographic structures;  microstructure;  plastic deformation;  recrystallization nucleation and growth;  grain growth;  local stress/strain analysis

DOI:

10.7502/j.issn.1674-3962.2017.03.04

文獻標志碼:

A

摘要:

三維X射線衍射技術（3DXRD）是一種新興的先進材料表征技術。該技術應用高能同步輻射X射線，可以表征塊體材料的三維晶體結構和應力狀態。同時測量是無損的，因此可以應用這一技術跟蹤材料內部的微觀組織隨時間的演化（也就是四維的結構表征）。高強度同步輻射X射線還保證了能夠對材料內部微米級結構的衍射信息進行快速、準確地測量。這一技術最早由前丹麥國家實驗室材料研究部以及歐洲同步輻射研究中心（ESRF）共同研究開發。幾年之后，美國橡樹嶺國家實驗室和美國先進光子源（APS）研究開發了另外一類3DXRD技術。目前已經可以在幾個大型的同步輻射中心應用3DXRD技術，例如ESRF、APS和日本的Spring-8。本文將綜述3DXRD技術，內容主要包括該技術的由來、基本原理、技術指標，以及該技術在金屬材料研究中的幾個應用實例。最后簡要介紹該技術的最新研究進展，并對其未來在材料科學研究中的應用前景進行展望。

Abstract:

The three-dimensional X-ray diffraction (3DXRD) is a new, advanced technique for materials characterization. This technique utilizes high-energy synchrotron X-rays to characterize the 3D crystallographic structure and strain/stress state of bulk materials. As the measurement is non-destructive, the microstructural evolution as a function of time can be followed, i.e. it allows 4D characterizations (x, y, z, t). The high brilliance of synchrotron X-rays ensure that diffraction signals from volumes of micrometer scale can be quickly detected and distinguished from the background noise, i.e. its spatial resolution can be micrometer scale and the measurement can be conducted within a reasonable time frame (a few hours). The 3DXRD microscope has originally been developed in cooperation between former Risø National Laboratory and the European Synchrotron Radiation Facility. Currently, this technique has been implemented in several large synchrotron facilities, e.g. the Advanced Photon Source (APS) in USA and the Spring-8 in Japan. Another family of 3DXRD technique that utilizes white beam synchrotron X-rays has also been developed in parallel in cooperation between Oak Ridge National Laboratory and APS. This article reviews the 3DXRD technique. The content includes the idea behind the technique, the principle and specification (spatial, angular, temporal resolutions and sample environment etc.) of the technique. Several applications of the techniques in metallurgy are given, including: grain-scaled stress analysis during tensile deformation, recrystallization growth kinetics, recrystallization nucleation, growth of individual recrystallized grain, grain growth after recrystallization, and local residual strain/stress analysis. The recent development of the 3DXRD technique and its potential use for materials science in the future will be briefly discussed at the end.