文章信息/Info

Title:

Applications of X-ray absorption fine structure in materials science

作者:

王  宇;  李  炯;  張  碩;  馬靜遠;  汪麗華;  魏向軍;  黃宇營;  姜  政

中國科學院上海應用物理研究所上海光源

Author(s):

WANG Yu;  LI Jiong;  ZHANG Shuo;  MA Jinyuan;  WANG Lihua;  WEI Xiangjun;  HUANG Yuying;  JIANG Zheng

Shanghai Institute of Applied of Physics, Chinese Academy of Sciences

關鍵詞:

材料科學; 同步輻射; XAFS;  時間分辨的XAFS; 原位XAFS

Keywords:

materials science;  synchrotron radiation;  XAFS;  Time-resolved XAFS;  in situ XAFS

DOI:

10.7502/j.issn.1674-3962.2017.03.05

文獻標志碼:

A

摘要:

X射線吸收精細結構(XAFS)方法是隨著同步輻射發展起來的獨特技術，是研究材料局域原子結構和電子結構的一種重要方法。相比于X射線衍射，XAFS僅僅對于吸收原子周圍局域結構敏感，樣品可以使固體、液體甚至是氣體。本文概述了XAFS的基本原理及幾種常用的實驗方法，結合上海光源的XAFS線站成果，介紹了近年來不同XAFS方法在催化、能源、納米和半導體等材料科學熱門研究領域的最新研究進展，展示了目前XAFS方法在材料科學研究中所發揮的重要作用，最后根據國內同步輻射光源和相關XAFS研究方法進一步發展，展望了XAFS技術在材料科學研究中應用前景。

Abstract:

X-ray absorption fine structure (XAFS) is a very powerful technique to investigate the local electronic and geometrical structure around the photoabsorber with the development of synchrotron radiation. In particular, its unique sensitivity to the local structure, as compared to x-ray diffraction (XRD) have been exploited for studying the gas, solution, or condensed matter. In this review, we report the principle and experimental method of XAFS and highlight recent applications on catalytic materials, energy materials, semiconductor materials and other hot fields of science research to help potential users in locating the spectrometer required for their materials science application. Finally, possible applications of XAFS are discussed according to the developing trend for XAFS method.