[1]楊春明,洪春霞,周平,等.同步輻射小角X射線散射及其在材料研究中的應用[J].中國材料進展,2021,40(02):112-119.[doi:10.7502/j.issn.1674-3962.202009018]
YANG Chunming,HONG Chunxia,ZHOU Ping,et al.Synchrotron Radiation Small Angle X-ray Scattering in Materials Research[J].MATERIALS CHINA,2021,40(02):112-119.[doi:10.7502/j.issn.1674-3962.202009018]
點擊復制
同步輻射小角X射線散射及其在材料研究中的應用(
)
中國材料進展[ISSN:1674-3962/CN:61-1473/TG]
- 卷:
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40
- 期數:
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2021年第02期
- 頁碼:
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112-119
- 欄目:
-
- 出版日期:
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2021-02-28
文章信息/Info
- Title:
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Synchrotron Radiation Small Angle X-ray Scattering in Materials Research
- 文章編號:
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16743962(2021)02011208
- 作者:
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楊春明1; 2; 3; 洪春霞1; 2; 周平1; 2; 繆夏然1; 2; 李小蕓1; 2; 李秀宏1; 2; 3; 邊風剛1; 2; 3
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(1中國科學院上海高等研究院 上海光源,上海201204)(2中國科學院上海應用物理研究所,上海201800)(3中國科學院大學,北京100049)
- Author(s):
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YANG Chunming1; 2; 3; HONG Chunxia1; 2; ZHOU Ping1; 2; MIAO Xiaran1; 2; LI Xiaoyun1; 2; LI Xiuhong1; 2; 3; BIAN Fenggang1; 2; 3
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(1Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China) (2Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China) (3University of Chinese Academy of Sciences, Beijing 100049,China)
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- 關鍵詞:
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小角X射線散射; 同步輻射; 掠入射X射線散射; 廣角X射線散射; 原位SAXS; 反常小角X射線散射
- Keywords:
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small angle X-ray scattering; synchrotron radiation; grazing incidence small angle X-ray scattering; wide angle X-ray scattering; in-situ SAXS; anomalous smallangle X-ray scattering
- 分類號:
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O57
- DOI:
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10.7502/j.issn.1674-3962.202009018
- 文獻標志碼:
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A
- 摘要:
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小角X射線散射(small angle X-ray scattering, SAXS)是研究物質內部一納米到數百納米甚至到微米尺度級別微觀結構的有力工具。近年來隨著我國同步輻射技術的不斷發展,同步輻射SAXS技術被越來越多地應用到各種材料的研究領域。然而,由于SAXS圖譜是倒空間的信號,并不像顯微鏡那么直觀,也不如X射線衍射(XRD)那么被大家所熟知。簡要介紹了SAXS的基本原理(稀疏體系、稠密體系),簡短回顧了我國同步輻射小角散射線站的發展和進步。主要介紹了最近十余年基于同步輻射SAXS原位實時檢測技術在高分子材料成型加工(結晶、取向性、周期性),原位SAXS和反常SAXS技術在合金相析出(成分、團簇尺寸),以及掠入射X射線散射在介孔薄膜(區域尺寸、位錯因子)和有機光伏薄膜等領域中的典型應用,并展望了同步輻射SAXS技術的發展趨勢及其在材料領域的應用前景。
- Abstract:
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Small angle X-ray scattering (SAXS) is a powerful tool for the studying of the microscopic structure of materials from 1 nm to hundreds of nm and even micron scale. With the development of synchrotron radiation technology in China, synchrotron radiation SAXS has been more and more applied to the research in various fields of materials. However, since SAXS is observed in a reciprocal space, it is not as intuitive as a microscope and is not as well known as X-ray diffraction (XRD). In this paper, the basic principles of SAXS (sparse system, dense system) are introduced, and the development and progress of synchrotron radiation SAXS beamline in China are also briefly reviewed. The typical applications of in-situ SAXS techniques are introduced, for example, in-situ real-time SAXS in polymer materials processing (crystallization, orientation, periodicity, etc.), in-situ and abnormal SAXS applications in the phase precipitation of the alloy (precipitation chemical composition, clusters size, etc.), and grazing incidence X-ray scattering in the mesoporous thin films (domain size, dislocation factor, etc.) as well as organic photovoltaic film, etc. Finally, the development trends of synchrotron radiation SAXS technology and its application prospect in materials research are also discussed.
備注/Memo
- 備注/Memo:
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收稿日期:20200916 修回日期:20210126 基金項目:國家自然科學基金資助項目(U1932118,U1732123);科技部重點研發計劃項目(2018YFB0704200,2017YFA0403000)第一作者:楊春明,男,1981年生,副研究員,碩士生導師, Email:yangchunming@zjlab.org.cn 通訊作者:邊風剛,男,1977年生,研究員,博士生導師, Email:bianfenggang@zjlab.org.cn
更新日期/Last Update:
2021-02-01