文章信息/Info

Title:

Application of Transmission Electron Microscope in Thermoelectric Materials

文章編號:

1674-3962(2022)12-1042-07

作者:

張成龍1; 李姝蓉1; 武海軍1; 何佳清2

（1. 西安交通大學 金屬材料強度國家重點實驗室，陜西 西安 710049）（2. 南方科技大學物理系，廣東 深圳 518000）

Author(s):

ZHANG Chenglong1;  LI Shurong1;  WU Haijun1;  HE Jiaqing2

(1. State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, China) (2. Department of Physics, Southern University of Science and Technology, Shenzhen 518000, China)

關鍵詞:

熱電材料; 透射電鏡; 結構性能關聯性; 缺陷; 熱電性能

Keywords:

thermoelectric materials;  transmission electron microscope;  structure-property correlation;  defect;  thermoelectric properties

分類號:

TB34；TN16

DOI:

10.7502/j.issn.1674-3962.202210001

文獻標志碼:

A

摘要:

熱電材料可以實現電能與熱能之間的直接相互轉化，有希望用來應對即將到來的能源危機，但較低的能源轉換效率限制了它的廣泛應用。材料的熱電特性與其微觀結構（如點缺陷、位錯、界面、第二相粒子、孔洞等）密切相關，對熱電材料進行精密微觀結構表征不僅對于深刻理解材料熱電性質至關重要，而且有助于設計具有所需性能的新材料。從電熱輸運性能計算公式出發，闡明了熱電材料結構與性能的相關性，展示了如何通過結構控制調控熱電材料電熱輸運性能，綜述了透射電鏡在熱電材料研究中的應用，包含對原子、納米和介觀全尺度缺陷結構表征。

Abstract:

Thermoelectric materials that realize the direct energy conversion between heat and electricity, have been considered as promising alternatives to meet the challenges of the global energy dilemma. However, the low energy conversion efficiency limits its wide application. The properties of thermoelectric materials are closely related to its microstructure(such as point defects, dislocations, interfaces, second phase particles, pores, etc.), the precise microstructure characterization of thermoelectric materials not only is crucial to profoundly understanding the material itself, but also helps to design new materials with properties. In this review, we illustrate the structure-property correlations from the perspective of calculation formula of electrical and thermal transport performance, and show how to tune the electrical and thermal transport performance of thermoelectric materials through structure control.The application of transmission electron microscope in thermoelectric materials is reviewed, including the characterization of atomic, nano and mesoscopic full-scale defect structures.